The Critical Role of High Resolution X-ray Micro- Computed Tomography for Ultra-thin Wall Space Component Characterization

A high resolution micro-computed tomography (μCT) system complemented by specialized hardware and software tools were used to provide quantitative characterization for a tapered ultrathin wall space component at NASA. The CT data served two purposes: first to assess whether an acceptable flaw condition based on acceptable use requirements existed and second to provide comprehensive flaw measurements for life modeling. Regarding the latter, the measurements were used in a fracture-mechanicsbased model to determine whether the components would be expected to survive four service lifes. This article will describe component acceptance criteria; the CT system hardware and procedure; detectability and measurement error assessment of the CT system, specialized software needed to aid the characterization process; example CT results; correlation with optical/SEM characterization; and an overview of the modeling technique utilizing the CT data.